Evolution of Ag nanostructures created from thin films: UV–vis absorption and its theoretical predictions

• Robert Kozioł,
• Marcin Łapiński,
• Paweł Syty,
• Damian Koszelow,
• Wojciech Sadowski,
• Józef E. Sienkiewicz and
• Barbara Kościelska

Beilstein J. Nanotechnol. 2020, 11, 494–507, doi:10.3762/bjnano.11.40

• cluster used. We plan to use a more advanced and less memory-consuming method, FETD (finite elements in time domain, FEM), in the future. Conclusion This work presents synthesis and UV–vis absorption studies of Ag nanostructures deposited on glass or silicon substrates. As shown, the formation of

Optical near-field mapping of plasmonic nanostructures prepared by nanosphere lithography

• Gitanjali Kolhatkar,
• Alexandre Merlen,
• Jiawei Zhang,
• Chahinez Dab,
• Gregory Q. Wallace,
• François Lagugné-Labarthet and
• Andreas Ruediger

Beilstein J. Nanotechnol. 2018, 9, 1536–1543, doi:10.3762/bjnano.9.144

• are compared to numerical simulations by finite elements. A good agreement is found, attesting to the validity of our method of analysis and making it an alternative technique to study the hot spots in plasmonic nanostructures. Results and Discussion As mentioned previously, the near-field information

Thermo-voltage measurements of atomic contacts at low temperature

• Ayelet Ofarim,
• Bastian Kopp,
• Thomas Möller,
• León Martin,
• Johannes Boneberg,
• Paul Leiderer and
• Elke Scheer

Beilstein J. Nanotechnol. 2016, 7, 767–775, doi:10.3762/bjnano.7.68

• = 0.15 Ω, which is converted into a temperature difference ΔT using simulations described in the next section. Simulations In order to derive ∆T at the junction from the resistance difference ∆RSens measured between the two sensor leads, finite elements simulations were carried out using COMSOL

Free vibration of functionally graded carbon-nanotube-reinforced composite plates with cutout

• Mostafa Mirzaei and
• Yaser Kiani

Beilstein J. Nanotechnol. 2016, 7, 511–523, doi:10.3762/bjnano.7.45

• frequency parameters of the FG-CNTRC plate with clamped boundary conditions. The frequencies are evaluated from the proposed approach of our study and compared with those given by Zhu et al. [4] based on the finite elements method. It is worth noting that in the analysis of Zhu et al. [4], the matrix is

• around and a cutout size is chosen as c/a = 0.5. The results are provided for various side-to-thickness ratios. A comparison is made between the results of our study with those obtained by Reddy [48] based on the finite elements method and by Ovesy and Fazilati [49] based on the finite strip method. The

A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

• Santiago D. Solares

Beilstein J. Nanotechnol. 2015, 6, 2233–2241, doi:10.3762/bjnano.6.229

• , as in the finite elements method (FEM), coupled with the dynamics of the cantilever. Given the number of research directions in which the AFM community is rapidly advancing, this may be unrealistic in terms of the knowledge and time required on the part of the user and in terms of computational cost

Nanometer-resolved mechanical properties around GaN crystal surface steps

• Jörg Buchwald,
• Marina Sarmanova,
• Bernd Rauschenbach and
• Stefan G. Mayr

Beilstein J. Nanotechnol. 2014, 5, 2164–2170, doi:10.3762/bjnano.5.225

• with experiments. Keywords: finite elements; gallium nitride; indentation; mechanical properties; molecular dynamics; nanostructures; Introduction Recently developed scanning probe-based techniques, such as contact resonance atomic force microscopy (CR-AFM) [1][2], allow for the assessment of

Probing the electronic transport on the reconstructed Au/Ge(001) surface

• Franciszek Krok,
• Mark R. Kaspers,
• Alexander M. Bernhart,
• Marek Nikiel,
• Benedykt R. Jany,
• Paulina Indyka,
• Mateusz Wojtaszek,
• Rolf Möller and
• Christian A. Bobisch

Beilstein J. Nanotechnol. 2014, 5, 1463–1471, doi:10.3762/bjnano.5.159

• for the Au/Ge structure is shown in Figure 5b. In addition, a line profile of the potential across a Au cluster and an idealized profile for the depicted simple wiring scheme is shown. To test our hypothesis we performed a simple finite elements simulation for a comparable conductive structure by

• shown in the middle and a potential profile from original data and its simplified form is also shown. a) Finite elements simulation for the potential if one single path connects a highly conductive cluster to a low conducting substrate while the borders of the cluster are not connected to the substrate

The optimal shape of elastomer mushroom-like fibers for high and robust adhesion

• Burak Aksak,
• Korhan Sahin and
• Metin Sitti

Beilstein J. Nanotechnol. 2014, 5, 630–638, doi:10.3762/bjnano.5.74

• mushroom-like fibers is investigated by implementing the Dugdale–Barenblatt cohesive zone model into finite elements simulations. It is found that the magnitude of pull-off stress depends on the edge angle θ and the ratio of the tip radius to the stalk radius β of the mushroom-like fiber. Pull-off stress

• results with findings in this work in section Results in detail. In this work we study the effect of geometry, defined by the edge angle θ and the ratio of the tip radius to the stalk radius β, on pull-off stress of mushroom-like fibers by using a cohesive zone model and finite elements (FE) simulations

Spring constant of a tuning-fork sensor for dynamic force microscopy

• Dennis van Vörden,
• Manfred Lange,
• Merlin Schmuck,
• Nico Schmidt and
• Rolf Möller

Beilstein J. Nanotechnol. 2012, 3, 809–816, doi:10.3762/bjnano.3.90

• point of application of the force that is about 0.3 mm from the end of the prong. According to the numerical calculations by the method of finite elements presented in the following, these values can be extrapolated for the end of the prong by a reduction of 1090 and 910 N/m for Torr Seal and UHU

• simulation using the finite element method To get more insight into the relevant details of the qPlus configuration, numerical calculations by using the method of finite elements were performed. In contrast to the experiment this enables analysis of the influence of one specific parameter, e.g., the

• the experimental errors. As expected these values are lower than for the ideal beam. To analyze the cause of the difference in detail, the method of finite elements (FEM) was applied. It reveals that the value of the rectangular beam of 12450 N/m is reduced to 10136 N/m, if one prong is rigidly